Tuesday, March 18, 2008 - 2:50 PM
Convention Center, Second Level, R07 (Ernest N. Morial Convention Center)
08175

Pharmaceutical Surface Defects: Correlation Between Microstructural Artifacts and Electropolishing Results

Nathan C. Eisinger, Special Metals Corporation; R. Keith Raney, UltraClean Electropolish Inc; Richard E. Avery, Avery Consulting Assoc Inc.

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